Skip to content | Change text size

 

ECSE Departmental Research Seminar, 19th April, 2006

Title: Multi-port Measurement of Microwave Devices with Agilent Vector Network Analysers


Speaker:

Jane Huynh, Agilent Technologies’ Component Test Division, Santa Rosa, California

Abstract:

Agilent is the key player of Microwave Measurement and Characterization apparatuses for many decades. Still now Agilent has been dominating the market developing and upgrading their previous microwave measurement systems. The seminar will present operation, configurations and calibration of microwave and millimeter-wave measurement tools, more specific on Multi-port Measurement of Microwave Devices.

Speaker' details:

Jane Huynh is a product marketing engineer with Agilent Technologies’ Component Test Division in Santa Rosa, California, and is a product manager for the PNA Series of vector network analyzers. Jane has more than 15 years of RF and Microwave measurement experience while working for Hewlett-Packard and Agilent Technologies. Jane holds a BSEE from the University of Washington in Seattle, and a MSEE from Stanford University in Palo Alto.

 
Visitors Information
A map of the Clayton Campus of Monash University indicates the venue, Building 72, and visitor parking on the top floor of the North carpark, Building 76.

Limited reserved parking spaces are available for visitors attending the seminar. (Requests for parking should be made in advance)